SiPaaS Solutions
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Test Service
  • Chip Test Plan Generation includes DFT plan, IP test solution
  • DFT Guideline, Test Pattern Generation Guideline
  • Load board , Probe Card, Design, socket, Change kit Manufacture
  • In-house tool for Test Pattern Conversion
  • Test Program Development, online debug
  • Test Program Optimization, Correlation, Release
  • Chip PVT Characterization Service

Example of PCIe IP Test, 5 G bps, external Loopback

High Speed Interface Test Solution

IP PVT Characterization